Enhanced sensitivity in dark-field microscopy by optimizing the illumination angle

TitleEnhanced sensitivity in dark-field microscopy by optimizing the illumination angle
Publication TypeJournal Article
AuthorsTaylor J.M, Bowen WP

Major funding support

Australian Research Council

The Australian Research Council Centre of Excellence for Engineered Quantum Systems (EQUS) acknowledges the Traditional Owners of Country throughout Australia and their continuing connection to lands, waters and communities. We pay our respects to Aboriginal and Torres Strait Islander cultures and to Elders past and present.